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Atomic Force Microscopy 
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The Asylum Research MFP3D-SA is a very versatile atomic force microscope, suitable for use with a wide range of samples and features a vast array of modes.

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It has a z-range of 40 um (extended head model) and an x and y movement of up to 90 um in a closed loop scan. The microscope differs from most others available on the market due to using seperate piezos for each plane. This allows for the use of nano-position sensors, minimising hysterisis and creep, whilst also ensuring flat scans.

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The MFP-3D is able to image conductive, semiconductive and insulating samples in both air and liquid environments. The head can be adjusted to fit a wide range of sample sizes and both top down and bottom up illumination of samples is possible.

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MFP3D also hosts conducting AFM tips with spatial resolution. 

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Specification

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  • X & Y scan - 90 um

  • Z scan - 40 um

  • X & Y noise - < 0.5 nm

  • Z noise - < 0.06 nm

  • More info here!

 

Capabilities (modes)

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  • Alternate contact, AC (tapping)

  • Contact mode

  • Conductive AFM (C-AFM)

  • Kelvin probe microscopy (SKPM)

  • Electrostatic force microscopy(EFM)

  • Dual AC

  • Force mapping

  • Nano-indentation

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