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X-ray photoelectron spectroscopy (XPS) with a load-locked KRATOS XSAM-800 instrument equipped with a dual anode X-ray source using a Mg Kα (1253.6 eV) excitation source operated at 12 kV and 10 mA.

 

The high magnification analyser mode was chosen to collect electrons from the smallest possible area on the specimen, ~ 4.0 mm2

General 

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A  XPS is available for sample analysis.  This instrument has both monochromatized and non-monochromatized X-ray sources and spatial imaging capabilities.  It is also equipped with a vacuum ultraviolet light source for ultraviolet photoelectron spectroscopy (UPS), a resterable ion gun for sample cleaning, depth profiling and an electron gun for scanning Auger electron spectroscopy (AES), a sample holder with cooling, heating, and five degrees (X, Y, Z, tilt, azimuthal) of motion, a load-lock sample introduction and transferring system, a sample preparation chamber, and appropriate software.

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This XPS instrument is available for analysis of samples from all members of the OU community as well as from outside users.
The instrument is located in Perry D building.
The facility is being operated by Dr Ajay Kumar Thakur, Lois Afua Damptey


Currently, all samples are to be analyzed by Dr. Ajay Kumar.  Student training or access to the instrument is available at the present time.


Technical supervision is being provided by Prof. Satheesh Krishnamurthy 

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Services Offered
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The capabilities of this instrument include:

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  1. Routine XPS analysis of samples. This includes wide scans and detailed analysis of specific elements. Binding energy resolution down to approximately 0.3 eV may be obtained by using the monochromatized X-ray source.

  2. Depth profile and angle-resolved XPS studies to investigate the composition variations of the sample versus depth.

  3. Spatially resolved XPS images, down to a few microns resolution. Individual spectra can be acquired on specific points of the sample.

  4. UPS spectra using both He I (21.2 eV) and He II (40.8 eV) UV sources. Other wavelengths (using other rare gases) may be possible.

  5. Scanning electron microscopy (SEM) imaging, down a few microns, and spatially resolved AES analysis using electron excitation.

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Acknowledgements

This instrument was acquired with funds from the Open university Major Research Instrumentation Program equipment fund, Royal Academy of Engineering and Space Strategic Research Area of the open university and SRA IDI  

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NEW XPS Coming soon!!!
UHV XPS with UPS
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